Institut Fresnel - UMR 7249 CNRS
Bâtiment Fresnel
Campus de St Jérôme
13397 Marseille cedex 20 - France

Tel : (33) (0)4-91-28-80-66
Fax : (33) (0)4-91-28-80-67

Hugues (Ugo) Giovannini was born in Milan (Italy) in 1963. From 1987 to 1991 he worked as an engineer at Société Bertin et Cie. He received his Ph. D. degree from the University of Aix-Marseille III in 1991. His doctoral research dealt with optical fiber sensors and interferometry. In 1991 he worked at Ecole Polytechnique de Montréal - Canada on weakly monomode tapered optical fibers. In 1991 he joined the Laboratoire d'Optique des Surfaces et des Couches Minces (now Institut Fresnel). He is Professor at Institut Universitaire de Technologie (IUT) de Marseille, he also gives lectures in the Erasmus Mundus Master Course Europhotonics-POESII. He has been involved in experimental and theoretical studies on scattering in Optics and Electromagnetism. Now his research interests concern mainly the development of high resolution optical imaging systems. He was director of Institut Fresnel from 2008 to 2011. He is coordinator of the Erasmus Mundus Europhotonics-POESII program.


Selection of publications in refereed journals

Please note: the copyrights to these publications are held by their publishers. The pdf-files provided here may be used only for single copies for personal use, as though they were reprints provided by mail. They may not be reposted on other web sites or used for any other purpose without the express permission of the appropriate publishers.

T. Zhang, C. Godavarthi, P. C. Chaumet, G. Maire, H. Giovannini, A. Talneau, M. Allain, K. Belkebir, A. Sentenac, "A Far-field diffraction microscopy at lambda/10 resolution", Optica 3, pp. 609-612 (2016).

A. Negash, S.Labouesse, N. Sandeau, M. Allain, H. Giovannini, J. Idier, R. Heintzmann, P. C. Chaumet, K. Belkebir, A. Sentenac, "Improving the axial and lateral resolution of three-dimensional fluorescence microscopy using random speckle illuminations",
J. Opt. Soc. Am. A 33, pp. 1089-1094 (2016).

C. Godavarthi, T. Zhang, G. Maire, P. C. Chaumet, H. Giovannini, A. Talneau, K. Belkbir, A. Sentenac, "Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm", J. Opt. Soc. Am. A 32, pp. 287-292 (2015).

T. Zhang, C. Godavarthi, P. C. Chaumet, G. Maire, H. Giovannini, A. Talneau, C. Prada, A. Sentenac, K. Belkebir, "Tomographic diffractive microscopy with agile illuminations for imaging targets in a noisy background", Opt. Lett. 40, pp. 573-576 (2015).

R. Ayuk, H. Giovannini, A. Jost, E. Mudry, J. Girard, T. Mangeat, N. Sandeau, R. Heinzmann, K. Wicker, K. Belkebir, A. Sentenac, "Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm", Opt. Lett. 38, pp. 4723-4726 (2013).

G. Maire, Y. Ruan, T. Zhang, P. C. Chaumet, H. Giovannini, D. Sentenac, A. Talneau, K. Belkebir, A. Sentenac, "High-resolution tomographic diffractive microscopy in reflection configuration", J. Opt. Soc. Am. A 30, pp. 2133-2139 (2013).

S. Arhab, G. Soriano, G. Maire, A. Talneau, D. Senteac, P. C. Chaumet, K. Belkebir, H. Giovannini, "Nanometric resolution with far-field optical profilometry" (PDF file), Phys. Rev. Lett. 111, 053902 (2013).

Y. Ruan, Y. P. Bon, P, E. Mudry, G. Maire, P. C. Chaumet, H. Giovannini, K. Belkebir, A. Talneau, B. Wattellier, S. Monneret, A. Sentenac, "Tomographic microscopy with a wavefront sensor" (PDF file), Opt. Lett. 37, pp. 1631-1633 (2012).

S. Arhab, H. Giovannini, K. Belkebir, G. Soriano, "Full polarization optical profilometry" (PDF file), J. Opt. Soc. of Am. A 29, pp. 508-515 (2012).

V. Brissonneau, L. Escoubas, F. Flory, G. Berginc, G. Maire, H. Giovannini, "Laser assisted fabrication of random rough surfaces for optoelectronics", Appl. Surf. Sci. 258, pp. 9171-9174 (2012)

S. Arhab, G. Soriano, K. Belkebir, A. Sentenac, H. Giovannini, "Full wave optical profilometry" (PDF file), J. Opt. Soc. of Am. A 28, pp. 576-580 (2011).

J. Girard, G. Maire, H. Giovannini, A. Talneau, K. Belkebir, P. C. Chaumet, A. Sentenac, "Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime"(PDF file), Phys. Rev. A 82, 061801(R) (2010).

O. Haeberlé, K. Belkebir, H. Giovannini, A. Sentenac, "Tomographic Diffractive Microscopy : Basics, Techniques and Perspectives" (PDF file), Journal of Modern Optics 57, pp. 686-699 (2010).

G. Maire, J. Girard, F. Drsek, H. Giovannini, A. Talneau, K. Belkebir, P. C. Chaumet, A. Sentenac, "Experimental inversion of optical diffraction tomography data with a nonlinear algorithm in the multiple scattering regime" (PDF file), Journal of Modern Optics 57, pp. 746-755 (2010).

P. C. Chaumet, A. Sentenac, K. Belkebir, G. Maire, H. Giovannini, "Improving the resolution of grating-assisted optical diffraction tomography using a priori information in the reconstruction procedure" (PDF file), Journal of Modern Optics 57, pp. 798-808 (2010).

G. Maire, F. Drsek, J. Girard, H. Giovannini, A. Talneau, D. Konan, K. Belkebir, P. C. Chaumet, A. Sentenac, "Experimental demonstration of quantitative imaging beyond Abbe's limit with optical diffraction tomography"(PDF file), Phys. Rev. Lett. 102, 213905 (2009).

A.Sentenac, K. Belkebir, H. Giovannini, P. C. Chaumet, "High-Resolution total-internal-reflection fluorescence microscopy using periodically nanostructured glass slides"(PDF file), J. Opt. Soc. of Am. A 26, pp. 2550-2557 (2009).

N. Sandeau, L. Wawrezinieck, P. Ferrand, H. Giovannini, H. Rigenault, "Increasing the lateral resolution of scanning microscopes by a factor of two using 2-image microscopy"(PDF file), J. of the Eur. Opt. Soc. 4, 09040 (2009).

C. Eyraud, J.-M. Geffrin, P. Sabouroux, P. C. Chaumet, H. Tortel, H. Giovannini, A. Litman, "Validation of a 3D bistatic microwave scattering measurement setup", Radio Science 43, RS4018 (2008).

A. Sentenac, K. Belkebir, H. Giovannini, P. C. Chaumet, "Subdiffraction resolution in total internal reflection fluorescence microscopy with a grating substrate"(PDF file), Opt. Lett. 33, pp. 255-257 (2008).

A. Sentenac, C.-A. Guérin, P. C. Chaumet, F. Drsek, H. Giovannini, N. Bertaux, M. Holschneider, "Influence of multiple scattering on the resolution of an imaging system: a Cramér-Rao analysis"(PDF file), Opt. Express. 15, pp. 1340-1347 (2007).

N. Sandeau, H. Giovannini, "Influence of the pinhole size on the resolution of the 4Pi' microscope studied by means of the optical transfer function"(PDF file), Nucl. Instr. and Methods in Phys. Res. A 571, pp. 404-406 (2007).

C. Eyraud, J.-M. Geffrin, A. Litman, P. Sabouroux, H. Giovannini, "Drift correction for scattering measurements"(PDF file), Appl. Phys. Lett. 89, 244104 (2006).

N. Sandeau, H. Giovannini, "Arrangement of a 4Pi microscope for reducing the confocal detection volume with two-photon excitation"(PDF file), Opt. Comm. 264, pp. 123-129 (2006).

N. Sandeau, H. Giovannini, "Increasing the lateral resolution of 4Pi microscopes"(PDF file), J. Opt. Soc. of Am A 23, pp. 1089-1095 (2006).

N. Sandeau, H. Giovannini, P. F. Lenne, H. rigneault, "Observation of the interferences between the emitted beams in a 4Pi microscope by partial coherence interferometry"(PDF file), Appl. Phys. Lett. 87, 181103 (2005).

N. Destouches, C. Deumié, H. Giovannini, C. Amra, "Index determination of opaque rough surfaces", Appl. Opt. 43, pp. 756-765 (2004).

L. Escoubas, J. J. Simon, M. Loli, G. Berginc, F. Flory, H. Giovannini, "An antireflective silicon grating working in the resonance domain for the near infrared spectral region"(PDF file), Opt. Comm. 226, pp. 81-88 (2003).

P. F. Lenne, D. Colombo, H. Giovannini, H. Rigneault, "Flow profiles and directionality in microcapillaries measured by fluorescence correlation spectroscopy"(PDF file), Single Molec. 3, pp. 194-200 (2002).

C. Deumié, H. Giovannini, C. Amra, "Angle-resolved ellipsometry of light scattering : discrimination of surface and bulk effects in substrates and optical coatings", Appl. Opt. 41, pp. 3362-3369 (2002).

A. Sentenac, H. Giovannini, M. Saillard, "Scattering from rough inhomogeneous media: splitting of surface and volume scattering"(PDF file), J. Opt. Soc. Am. A 19, pp. 727-736 (2002).

N. Destouches, C. A. Guérin, M. Lequime, H. Giovannini, "Determination of the phase of the diffracted field in the optical domain. Application to the reconstruction of surface profiles"(PDF file), Opt. Comm. 198, pp. 233-239 (2001).

N. Destouches, H. Giovannini, M. Lequime, "Interferometric measurement of the phase of diffracted waves near the plasmon resonances of metallic gratings"(PDF file), Appl. Opt. 40, pp. 5575-5582 (2001).

H. Rigneault, F. Lemarchand, A. Sentenac, H. Giovannini, "Strong extraction coefficient for sources located inside waveguide gratings", J. of Opt. A 1, pp. 507-511 (1999).

F. Lemarchand, A. Sentenac, E. Cambril, H. Giovannini, "Study of the resonant behavior of waveguide gratings : increasing the angular tolerance of guided-mode filters", J. of Opt. A 1, pp. 545-551 (1999).

H. Rigneault, F. Lemarchand, A. Sentenac, H. Giovannini, "Extraction of light from sources located inside waveguide grating structures"(PDF file), Opt. Lett. 24, pp 148-150 (1999).

F. Lemarchand, A. Sentenac, H. Giovannini, "Increasing the angular tolerance of resonant grating filters with doubly periodic structures"(PDF file), Opt. Lett. 23, pp. 1149-1151 (1998).

C. Mahodaux, H. Rigneault, H. Giovannini, L. Escoubas, P. Moretti, "Mechanical properties of optical thin films deposited by the ion plating technique", Microscopy, Microanalysis, Microstructures 8, pp. 251-260 (1998).

H. Giovannini, M. Saillard, A. Sentenac, "Numerical study of scattering from rough inhomogeneous films"(PDF file), J. Opt. Soc. Am. A 15, pp. 1182-1191 (1998).

H. Giovannini, C. Amra, "Dielectric thin films for maximized absorption with standard quality black surfaces"(PDF file), Appl. Opt. 37, pp. 103-105 (1998).

H. Giovannini, C. Amra, "Scattering-reduction effect with overcoated rough surfaces: theory and experiment"(PDF file), Appl. Opt. 36, pp. 5574-5579 (1997).

H. Giovannini, C. Deumié, H. Akhouayri, C. Amra, "Angle-resolved polarimetric phase measurement for the characterization of gratings"(PDF file), Opt. Lett. 21, pp. 1619-1621 (1996).

C. Deumié, H. Giovannini, C. Amra, "Ellipsometry of light scattering from multilayer coatings"(PDF file), Appl. Opt. 35, pp. 5600-5608 (1996).

S. Dokulilova, H. Akhouayri, H. Giovannini, "Strain sensor with low temperature sensitivity based on a weakly multimode optical fiber using coherence multiplexing", J. Eur. Opt. Soc. A 5, pp. 833-844 (1996).

H. Giovannini, "Le multiplexage de cohérence : principes et applications", Ann. Phys. Fr. 20, pp. 655-663 (1995).

H. Giovannini, H. Akhouayri, "Interferometric configuration based on a grating interferometer for the measurement of the phase between TE and TM polarizations after diffraction by gratings"(PDF file), Opt. Lett. 20, pp. 2255-2257 (1995).

D. Konan, H. Giovannini, S. Huard, X. Daxhelet, "Temperature measurement with a tapered monomode fibre by coherence multiplexing technique", J. Eur. Opt. Soc. A 3, pp. 679-685 (1994).

H. Giovannini, M. Lequime, S. Huard, "Influence of chromatic dispersion on phase measurement in dual wave-length passive homodyne detection method for fiber-coupled interferometers", Appl. Opt. 33, pp. 2721-2733 (1994).

H. Giovannini, D. Yeddou, S. Huard, M. Lequime, C. Froehly, "Detection scheme for white-light interferometric sensors"(PDF file), Opt. Lett. 18, pp. 2074-2076 (1993).

H. Giovannini, D. Konan, S. Huard, F. Gonthier, S. Lacroix, J. Bures, "Modal interference in all-fibre sensor measured by coherence multiplexing technique", Elec. Lett. 29, pp. 29-30 (1993).


Chapters in books

O. Haéberlé, A. sentenac, H. Giovannini, "An introduction to diffractive tomographic microscopy"(PDF file), Modern research and educational topics in microscopy, vol. II, Antonio Mendez Vilas, Jesus Diaz Alvarez ed. pp. 956-967 (2007). ISBN : 978-84-611-9418-6.