Seminar Thrusday, 5th february 2015, 10:30 a.m. Room Pierre Cotton (Institut Fresnel, level -1)
Title : Visualizing lattice structure in thin films with new 2D and 3D Bragg ptychography approaches
Abstract :
"X-ray ptychography implemented in the Bragg geometry combines the robustness of ptychographic imaging, the structural sensitivity of Bragg diffraction, and the ability of hard x-rays to nondestructively probe materials in realistic environments. Here, we will discuss the theory and application of our 2D Bragg Projection Ptychography approach in imaging strain fields in semiconductor and ferroelectric thin films. We will also introduce a new approach, 3D Bragg Projection Ptychography, that enables 3D imaging of materials structure using scanning probe coherent diffraction data measured at a single incident Bragg angle."
Contact : Hruszkewycz, Stephan O.
Invitation : Virginie CHAMARD et Marc ALLAIN, équipe SEMOX
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