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CpP
The 80 project involves two CNRS institutes : INSB with the MDVA1 group from the IRIM2 in Montpellier INSIS with the CONCEPT and RCMO3 groups from the Fresnel Institute in Marseille.
The aim of the CpP project is to demonstrate the contribution of all-dielectric resonant supports [1-6] as support lamellae (called e-substrates) for TIRF microscopy and associated microscopy techniques (PALM, ImFCS ...). This contribution will be tested using controlled molecular models [7] (models (...)

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In parallel to these studies of the optical and spectral properties of single- and multi-layer stacks, theoretical and experimental works have been performed on the effect of mechanical stresses in thin layers on the warpage induced effects of substrates.
Some first studies have allowed characterizing precisely the dependence of stress level on layer thickness for various classical materials.
In particular, we have demonstrated a non-linear dependence of stress on layer thickness.
This (...)