Seminar "Simple methods for modeling and measuring optical coherence and polarization" by Miguel A. Alonso (The Institute of Optics, University of Rochester, USA) on Thursday 26 of June, 02:00 p.m., Faculté des Sciences St Jérôme, Institut Fresnel, Room Pierre Cotton (level -1).
Abstract : The description and measurement of the coherence and polarization properties of a wave field are of great importance in a range of applications, including the characterization of sources to be used in imaging systems. Several standard methods exist for performing such measurements, most of which either consist of elaborate interferometric setups or rely on a series of sequential measurements. This presentation will provide a brief review of the concepts of coherence and polarization, and some approaches for modeling the propagation of partially coherent, partially polarized light, both in the paraxial and nonparaxial regimes. It will also include a description of two new, very simple techniques that can be used for their characterization. The first of these techniques, used for measuring coherence, relies on analyzing the shadow/penumbra of a small obstacle, while the second, used for measuring polarization, relies on the use of glass windows with anisotropic stress-induced birefringent patterns.
Contact :
Miguel A. Alonso
Associate Professor
Chair, Graduate Admissions
The Institute of Optics
University of Rochester
USA
http://www.optics.rochester.edu/people/faculty/alonso_miguel
Invitation : Philippe Réfrégier, Professeur, École Centrale de Marseille - équipe PHYTI, Institut Fresnel
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