Team : Thématiques
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Polarization-based measurements
Principal investigator : Miguel A. Alonso
Keywords : polarization, SEO, q-plate, shearing interferometry, birefringence, scatterometry.
This work involves the measurement of nanostructures by using light with tailored polarization distributions, the measurement of the phase of light by using polarization-modifying optical elements, and the measurement of the polarization of light. These measurements are based on the use of spatially-varying birefringent optical elements such as stressed-engineered optics (SEOs) and liquid crystal devices.
Publications
2021
Reverberant Elastography for the Elastic Characterization of Anisotropic Tissues
L.A. Alemán-Castañeda , F. Zvietcovich, and K.J. Parker
IEEE Journal of Selected Topics in Quantum Electronics 27, 7201312 (2021)
L.A. Alemán-Castañeda , F. Zvietcovich, and K.J. Parker
IEEE Journal of Selected Topics in Quantum Electronics 27, 7201312 (2021)
2020
Birefringent Fourier filtering for single molecule Coordinate and Height super-resolution Imaging with Dithering and Orientation
V. Curcio, L.A. Alemán-Castañeda, T.G. Brown, S. Brasselet and M.A. Alonso
Nature Comm. 11, 5307 (2020)
V. Curcio, L.A. Alemán-Castañeda, T.G. Brown, S. Brasselet and M.A. Alonso
Nature Comm. 11, 5307 (2020)
Maximum likelyhood estimation in the context of an optical measurement
A. Vella and M.A. Alonso
Chapter 7 of Progress in Optics 65 (Elsevier, Amsterdam, 2020) pp. 231-311 (2020).
A. Vella and M.A. Alonso
Chapter 7 of Progress in Optics 65 (Elsevier, Amsterdam, 2020) pp. 231-311 (2020).
2019
Optimal birefringence distributions for imaging polarimetry
A.J. Vella and M.A. Alonso
Opt. Express 27, 36799-36814 (2019).
A.J. Vella and M.A. Alonso
Opt. Express 27, 36799-36814 (2019).
Simultaneous measurement of multiple parameters of a subwavelength structure based on the weak value formalism
A. Vella, S.T. Head, T.G. Brown, and M.A. Alonso
Phys. Rev. Lett. 122, 123603 (2019).
A. Vella, S.T. Head, T.G. Brown, and M.A. Alonso
Phys. Rev. Lett. 122, 123603 (2019).
Shearing interferometry via geometric phase
L.A. Alemán-Castañeda, B. Piccirillo, E. Santamato, L. Marrucci, and M.A. Alonso
Optica 6, 396-399 (2019).
L.A. Alemán-Castañeda, B. Piccirillo, E. Santamato, L. Marrucci, and M.A. Alonso
Optica 6, 396-399 (2019).
2018
Poincaré sphere representation for spatially varying birefringence
A. Vella and M.A. Alonso
Opt. Lett. 43, 379-382 (2018).
A. Vella and M.A. Alonso
Opt. Lett. 43, 379-382 (2018).
Measuring vector field correlations using diffraction
K.A. Sharma, G. Costello, E. Vélez-Juárez, T.G. Brown and M.A. Alonso
Opt. Express 26, 8301-8313 (2018).
K.A. Sharma, G. Costello, E. Vélez-Juárez, T.G. Brown and M.A. Alonso
Opt. Express 26, 8301-8313 (2018).
Birefringent distributions tailored for imaging and other applications
M.A. Alonso and A. Vella
17th Workshop on Information Optics (WIO), IEEE 1-3 (2018). doi : 10.1109/WIO.2018.8643458
M.A. Alonso and A. Vella
17th Workshop on Information Optics (WIO), IEEE 1-3 (2018). doi : 10.1109/WIO.2018.8643458
2016
Single shot polarimetry of multicore fiber
S. Sivankutti, E.R. Andresen, G. Bowmans, T.G. Brown, M.A. Alonso, and H. Rigneault
Opt. Lett. 41, 2105-2108 (2016).
S. Sivankutti, E.R. Andresen, G. Bowmans, T.G. Brown, M.A. Alonso, and H. Rigneault
Opt. Lett. 41, 2105-2108 (2016).
2014
Pinhole array implementation of Star Test Polarimetry
B.G. Zimmerman, R. Ramkhalawon, M.A. Alonso, and T.G. Brown
Three-Dimensional and Multidimensional Microscopy : Image Acquisition and Processing XXI, SPIE proceeding 8949, 894912 (2014).
B.G. Zimmerman, R. Ramkhalawon, M.A. Alonso, and T.G. Brown
Three-Dimensional and Multidimensional Microscopy : Image Acquisition and Processing XXI, SPIE proceeding 8949, 894912 (2014).
Focused beam scatterometry for deep subwavelength metrology
T.G. Brown, M.A. Alonso, A. Vella, M.J. Theisen, S.T. Head, S.R. Gillmer, and J.D. Ellis
Three-Dimensional and Multidimensional Microscopy : Image Acquisition and Processing XXI, SPIE proceeding 8949, 89490Y (2014).
T.G. Brown, M.A. Alonso, A. Vella, M.J. Theisen, S.T. Head, S.R. Gillmer, and J.D. Ellis
Three-Dimensional and Multidimensional Microscopy : Image Acquisition and Processing XXI, SPIE proceeding 8949, 89490Y (2014).
Weak measurements applied to process monitoring using focused beam scatterometry
T.G. Brown, M.A. Alonso, A. Vella, M.J. Theisen, and S.T. Head
Metrology, Inspection, and Process Control for Microlithography XXVIII, SPIE proceeding 9050, 90501F (2014).
T.G. Brown, M.A. Alonso, A. Vella, M.J. Theisen, and S.T. Head
Metrology, Inspection, and Process Control for Microlithography XXVIII, SPIE proceeding 9050, 90501F (2014).
2013
Imaging the polarization of a light field
R. Ramkhalawon, T.G. Brown, and M.A. Alonso
Opt. Express 21, 4106-4115 (2013).
R. Ramkhalawon, T.G. Brown, and M.A. Alonso
Opt. Express 21, 4106-4115 (2013).
ResearchGate
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