Special Issue on « Recent Trends in Near-Field Scanning Microscopy »

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Special issue opened for submission – Manuscript due by the 1st of September 2017 – Intended publication January 2018.

Call for papers for the Special Issue "Recent Trends in Near-Field Scanning Microscopy" of the journal Scanning.

In this special issue, we invite researchers to submit original papers, as
well as review articles, that will stimulate the continuing efforts in
the development of new tools for near-field scanning microscopy as well
as theoretical methods aimed at the understanding of electromagnetic
fields at nanoscales. For more details please see the attached file.

Authors can submit their manuscripts through the Manuscript Tracking
System here

 Manuscripts are due by the 1st of September, 2017
 First Round of Reviews is planed for 24th of November, 2017
 Publication Date is intended by 19th of January, 2018

Annoucement Special Issue
"Recent Trends in Near-Field Scanning Microscopy"

The lead guest editor :
Sergey Sukhov, University of Central Florida, Orlando, USA

The guest editors :
F. Biccari, University of Florence, Italy
A. L. Lereu, CNRS AMU - Institut Fresnel, Marseille, France
F. Dilip K. Singh, National Physical Laboratory, New Delhi, India

Contact :
Aude Lereu, Institut Fresnel – aude.lereu@fresnel.fr